电子元器件破坏性物理分析方法国内外发展趋势

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Domestic and International Development Trends of Destructive Physical Analysis (DPA) Methods for Electronic Components

WANG Shuang ZHOU Qinyuan (China Electronics Standardization Institute)

Abstract:With thesignificantadvances inmanufacturing technology,therapid increaseinmarketdemand,and the application of new materialsand processs,electroniccomponents are developing towards diversification,integrationand systematization.This paper aims to summarize the evolutionofDestructive Physical Analysis (DPA)methods for electronic components based on the research on revision of standards for DPA methods at home and abroad.

Keywords:DestructivePhysical Analysis; electronic components; development trends

0 引言

量与可靠性水平,确保其使用中的可靠性[

在元器件质量检测和可靠性评价的研究中，破坏性物理分析是一种常用的技术手段，对于提升产品可靠性水平具有其他试验和检验手段无法替代的作用。（剩余6000字）