电子工程硬件单粒子效应故障出现原因及故障率控制方案

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中图分类号：0572；TN3 文献标志码：A 文章编码：1672-7274（2025）09-0036-03

The Cause of Single Event Effect Fault in Electronic Engineering Hardware and the Control Scheme of Fault Rate

ZHOUZaibao

（Shandong Shanxian talent recruitment service center，Shanxian 2743oo， China）

Abstract： Single event efect is the electrical performance failure phenomenon caused by the impact of a single particle inelectronicdevices.Theseefectswillcause thelogicalstateofelectronicdevices tochange，andthefunction of devices willbe disturbed or completely disabled.By studying the single event effect， we can understand the influence mechanismof single event efecton electronic devices，and take targeted protective measures to improve the reliabilityof thesystem.Basedonthis，this paper analyzes thecausesofsingle event effect failure，and proposes anti radiation design，redundant backupand other methods for the main factors causing single event efect failure，so as to provide technical support for the maintenance of electronic engineering hardware.

Keywords： single event effect; radiation resistant design; redundant backup

电子工程硬件中的单粒子效应故障是影响系统可靠性和稳定性的重要因素。（剩余4444字）