薄膜太阳能电池缺陷成像方法应用研究进展

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关键词:有机光伏电池;钙钛矿光伏电池;缺陷成像;失效机制;均匀性分析中图分类号:TM914.4 文献标识码:ADOI:10.37188/CJL.20250058 CSTR:32170.14.CJL.20250058
Abstract:Inthecontextof accelerated globalenergy transition,nano-thin-film solarcells,including organic photovoltaiccels(OPVs)and perovskitesolarcels(PSCs),have garnered widespread attention due totheirhighefficiency,low cost,and ease offabrication.Currently,the laboratory-recorded power conversion effciency(PCE)of single-junction OPVs has surpassed 20% ,while that of PSCs has exceeded 26% .This paper beginswith an overview of thestructures of OPVsand PSCs,summarizing the primary failure mechanisms of these cells,focusing on electrodes,charge transportlayers,and photoactivelayers.Subsequently,itoutlines commonmicrodefectimaging principlesand methods,including photoluminescence(PL),electroluminescence(EL),laserbeam-induced current imaging(LBIC),and lock-in thermography(LIT).The paperreviews thelatest advancements in micro-defect imaging and the homogeneity research for OPVsand PSCs,highlights current limitations in micro-defect imaging,and suggests future development directions.This paper provides a comprehensive overview of the micro-defect imaging methods and applications for nano-thin-film solar cells.
KeyWords:organic photovoltaiccels;perovskitesolar cels;micro-area defect imaging;failure mechanisms;homogeneity analysis
1引言
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