微型电磁继电器性能退化分析方法综述

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关键词：微型电磁继电器；性能退化；故障树分析；仿真模型；机器视觉中图分类号：TM58 文献标志码：A 文章编号：2095-8188（2026）01-0001-08DOI：10.16628/j.cnki.2095-8188.2026.01.001

A Comprehensive Review of Performance Degradation Analysis Methods for Micro-Electromagnetic Relays

TAN Li， WANGZhaobin

（School of Automation，Jiangsu University of Science and Technology，Zhenjiang 212OO3，China）

Abstract：The currnt research status regarding the performance degradation of micro-electromagnetic relays is elaborated.The characteristics and applicability of existing performance degradation analysis methods for microelectromagneticrelaysaresystematicallycollatedand comparativelyanalyzed，and theapplicationsofanalytical methods suchas fault tree analysis（FTA），simulation modeling and machine vision arecomprehensively reviewed. Basedoan in-depthreviewofrecentresearch literature，theadvantagesanddisadvantagesof existinganalytical methods aresystematicalysummarized，thereby providing efective strategies and improvement ideas for enhancing thereliabilityof power systems.Although various methodscanachieve theperformance degradationanalysisof micro-electromagneticrelays toacertain extent，thereare still significant differences inaccuracy，applicabilityand usability.Thefutureresearch direction is focusedon integrating image procesingand deeplearning technologies， achieving theautomatic extraction of defect featuresand monitoringof dynamic electrical parameters，and establishing themapping relationship betweenphysical defectsandperformance degradation，soasto improve the practicality and applicability of the analysis.

Key words：micro-electromagnetic relays； performance degradation；fault tree analysis； simulationmodel；machinevision

0 引言

微型电磁继电器具有体积小、质量轻、切换电流范围广等优势，因此广泛应用在数字控制电路、数据传输电路、微弱功率控制系统及各种接口电路中[1-3]。（剩余10682字）