用于二维光电器件的高分辨率光电流成像系统

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中图分类号：TN29文献标志码：A

Abstract： Photocurrent scanning imaging is an important test technique revealing the material unimity potential distribution two-dimensional material optoelectronic devices. However， current domestic reports lack systematic descriptions photocurrent scanning systems construction， particularly regarding focusing optical path assembly methods improving scanning resolution. To reduce trial--error costs researchers， this study integrates an efficient spatial filtering system to develop a high-resolution photocurrent scanning microscopy system approaching the diffraction limit. It realized a high-resolution photocurrent scanning microscopy imaging system with spatial resolution close to the diffraction limit which was combined with efficient spatial filtering system. The measurements excitation transport electron-hole pairs in photodetectors based on MoS2 two-dimensional semiconductor materials were demonstrated. It also systematically studied the distribution photocurrent near the asymmetric Schotky junctions briefly analyzed the mechanism photocurrent mation. The system can be adopted in some medium small-sized laboratory in China to conveniently replicate build their own photocurrent scanning systems， which reduces some trial--error costs greatly improves the research ability two-dimensional material optoelectronic devices.

Keywords： two-dimensional material; photodetector; photocurrent scanning; MoS2

由于在微电子和光电子领域的潜在应用前景，基于二维材料的光电子器件，特别是光电探测器近年来成为研究热点，并取得了显著进展[1]过渡金属硫族化物（transitionmetaldichalcogen-ides，TMDCs）二维半导体材料具有优异的材料稳定性、独特的层状结构、良好的电子迁移率等特性，在光电探测器、场效应晶体管、传感器、太阳能电池等领域展现出巨大的应用前景[2-4]。（剩余8416字）