基于CGSPN的复杂电子系统测试性参数确定方法

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关键词：电子系统；测试性参数；着色广义随机Petri网；共因故障；故障并发 中图分类号：TP206；TH702 文献标志码：A DOI：10.12305/j.issn.1001-506X.2025.05.15

Abstract：Due to theextensive use of distributed，integrated，and modular solutions，complex electronic systems are prone to new issues such as common-cause failures and fault concurrency，which are diffcult to address using traditional methods for determining testability parameters.To address the above isue，a novel method for determining testability parameters for complex electronic systems based on colored generalized stochastic Petri nets （CGSPN） is proposed. Firstly，by incorporating requirements such asdemand information， constraint boundaries，and maintenance support，a two-level CGSPN model for electronic systems is established.Coloring is introduced to enable real-time tracking of various states of different modules and to handle fault concurrency，while generalized stochastic processing addresses the randomness of common-cause failures.Secondly，a testability parameter processng method incorporating redundancy design is explored throughcoloring andavailability，whichenriches the testability system.Finally，a parallel analysis technique integrating diferent modules and various states is developed，unifying the state transition relationships between system and module levels，and avoiding stage-wise serial processing and equivalent replacement. An example analysis of communication navigation identification （CNI） system demonstrates that the proposed method offers better usability and effectiveness compared to traditional approaches.

Keywords：electronic systems；testability parameters；colored generalized stochastic Petri nets（CGSPN）; common-cause failures；fault concurrency

0 引言

现代电子系统已发展为高度分布式管理和集中控制的分布式综合模块化电子架构，这种架构能够支持处理资源和硬件模块的分布式部署，并实现高精度的网络同步与并行处理，从而显著增强硬件的灵活性，以及各功能区域之间的互连、互通和互操作性[1-6]。（剩余17778字）