相位调控双向剪切散斑干涉表面变形测量

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关键词:干涉测量;剪切干涉;相位调控;时间相移;表面变形测量中图分类号:TP394.1;O436.1文献标识码:Adoi:10.37188/OPE.20253315.2390 CSTR:32169.14.OPE.20253315.2390

Measurement of surface deformation using phase-manipulated dual-directional shearography

QI Siyuan,FANG Weidong,LIU Yilong,CHANG Qing,GAO Shuai,WANG Shengjia (College of Physics and Optoelectronic Engineering, Harbin Engineering University , Harbin150001,China) * Corresponding author,E-mail: shengjia. wang@hrbeu. edu. cn

Abstract:To address the issue of the directional sensitivity of conventional shearography,a phase manipulating bidirectional shearography technique is proposed. This technique regards imaging,shearing,and phase-shiftingas the phase transformation of the object wave.First,two Fresnel diffraction lenses are used to generate two laterally displaced images,forming shearograms.Then,by dynamically loading the dual-lens phase masks with different phase baselines on the liquid crystal spatial light modulator,phaseshifted shearograms are generated,and the temporal phase-shifting method is adopted for phase retrieval. The results indicate:the phase manipulating bidirectional shearography can adjust the shearing direction and amount,and introduce controllable temporal phase shifts.When using conventional shearography to reconstruct the deformation phase,the error in the non-shearing direction is 3.5-4.6 times that in the shearing direction.While using bidirectional shearography to reconstruct the deformation phase,the error levels in both shearing directions are similar and the error deviation is 8% . The phase manipulating bidirectional shearography technique has the characteristics of simple structure and high integration,providing an optical interferometry solution with single-wavelength,single-polarization,single-camera,single-aperture for high-precision deformation measurement.

Key words: interferometry;shearography; phase manipulating; temporal phase shift; surface deforma-tion measurement

1引言

剪切散斑干涉技术[1-3]是一种全场、非接触、高精度、高灵敏度的光学测量方法,其核心在于利用两束横向错位的物光形成剪切干涉,无需传统意义上的参考光,被广泛应用于航空航天、精密机械制造、工程材料无损检测等领域[4-6]。(剩余15249字)

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